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Publication Detail
Absence of defect state creation in nanocrystalline silicon thin film transistors deduced from constant current stress measurements
  • Publication Type:
    Journal article
  • Publication Sub Type:
    Article
  • Authors:
    Esmaeili-Rad MR, Sazonov A, Nathan A
  • Publication date:
    2007
  • Journal:
    Applied Physics Letters
  • Volume:
    91
  • Print ISSN:
    0003-6951
  • Notes:
    113511-1-3
Abstract
No abstract found
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