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Publication Detail
Noise Performance of high fill factor pixel architectures for robust large-area image sensors using amorphous silicon technology
  • Publication Type:
    Conference
  • Authors:
    Lai J, Vygranenko Y, Heiler G, Safavian N, Striakhilev D, Nathan A, Tredwell T
  • Publisher:
    Materials Research Society
  • Publication date:
    2007
  • Place of publication:
    Warrendale, US
  • Pagination:
    327, 332
  • Published proceedings:
    Amorphous and polycrystalline thin-film silicon science and technology - 2007: symposium held April 9-13, 2007, San Francisco, California, U.S.A.
  • Volume:
    989
  • Series:
    Materials Research Society symposia proceedings
  • Editors:
    Chu V,Miyazaki S,Nathan A,Yang J,Zan HW
  • ISBN-13:
    9781558999497
  • Status:
    Published
  • Language:
    English
Abstract
Large area digital imaging made possible by amorphous silicon thin-film transistor (a-Si TFT) technology, coupled with a-Si photo-sensors, provides an excellent readout platform to form an integrated medical image capture system. Major development challenges evolve around optimization of pixel architecture for detector fill factor, signal propagation performance, and manufacturability, while suppressing noise stemming from pixel array and external electronics. This work analyzes a novel vertically integrated pixel design based on signal readout and noise performance, and compares with conventional co-planar and continuous detector architectures. In addition, the analysis will consider various substrate options including glass and robust substrates such as polymer and metal foil. Our evaluation have demonstrated state-of-the-art radiographic detector system with electronic noise under 2000 electrons at 150 ┬Ás frame time for an imaging arrays on robust substrate.
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