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Publication Detail
Ferroelectric domains in epitaxial PbxSr1- xTiO3 thin films investigated using X-ray diffraction and piezoresponse force microscopy
Abstract
© 2016 Author(s).We present a detailed study of compressively strained PbxSr1-xTiO3 thin films grown by off-axis radio frequency magnetron sputtering on (001)-oriented Nb-doped SrTiO3 substrates. Film tetragonality and the ferroelectric critical temperatures are measured for samples of different composition and thickness and compared with a phenomenological Landau-Devonshire model. 180° ferroelectric domains are observed using both X-ray diffraction and piezoresponse force microscopy and domain sizes obtained by the two techniques are compared and discussed.
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