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Publication Detail
X-RAY DIFFRACTION APPLIED TO THE STUDY OF DEFECTS IN SURFACES.
  • Publication Type:
    Conference
  • Authors:
    Robinson IK, D'Amico KL
  • Publication date:
    01/12/1985
  • Pagination:
    161, 170
  • Published proceedings:
    Materials Research Society Symposia Proceedings
  • Volume:
    41
  • ISBN-10:
    0931837065
  • Status:
    Published
  • Print ISSN:
    0272-9172
Abstract
The role of x-ray diffraction in characterising defects in crystals is reviewed briefly. It is most sensitive to the presence of plane defects which destroy the long-range order. The same argument is shown to apply to line defects in surface structures. Two recent glancing incidence x-ray diffraction experiments provide contrasting examples: randomly distributed steps are found in the Au(110) reconstructed surface, while regular array of domain walls modify certain phases of krypton monolayers physisorbed on graphite substrates.
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