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Publication Detail
Spatial resolution assessment of Nano-SQUIDs made by focused ion beam
  • Publication Type:
    Journal article
  • Publication Sub Type:
    Article
  • Authors:
    Hao L, Macfarlane JC, Gallop JC, Romans E, Cox D, Hutson D, Chen J
  • Publisher:
    IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
  • Publication date:
    06/2007
  • Place of publication:
    US
  • Pagination:
    742, 745
  • Journal:
    IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
  • Volume:
    17
  • Issue:
    2
  • Status:
    Published
  • Country:
    US
  • Print ISSN:
    1051-8223
  • Language:
    EN
  • Keywords:
    magnetic field sensitivity, nanoscale SQUID, spatial resolution, superconductor, JUNCTIONS, NOISE
  • Addresses:
    Natl Phys Lab
    Teddington
    Middx
    TW11 0LW
    England

    Univ Strathclyde
    Dept Phys
    Glasgow
    Lanark
    G4 0NG
    Scotland

    UCL
    London Ctr Nanotechnol
    London
    WC1H 0AH
    England

    Univ Surrey
    ATI
    Surrey
    GU2 7XH
    England

    Brunel Univ
    Sch Engn & Design
    Uxbridge
    Middx
    UB8 3PH
    England
Abstract
The ability to reduce SQUID dimensions into the submicrometer or nanometer regime points the way towards novel applications, particularly in emerging fields such as quantum information processing, single-photon/particle detection, and experimental studies of nano-scale entities such as Bose-Einstein condensates. We report here on our ongoing work combining traditional thin-film and photolithographic fabrication processes with computer-aided-design software and focused ion beam milling to realize sub-micrometer superconducting structures. Their magnetic field sensitivity, noise behavior, spatial resolution, and prospects for magnetic spin detection are discussed.
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