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Publication Detail
Improving test quality using robust unique input/output circuit sequences (UIOCs)
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Publication Type:Journal article
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Publication Sub Type:Article
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Authors:Guo Q, Hierons RM, Harman M, Derderian K
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Publisher:ELSEVIER SCIENCE BV
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Publication date:01/08/2006
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Pagination:696, 707
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Journal:INFORMATION AND SOFTWARE TECHNOLOGY
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Volume:48
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Issue:8
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Status:Published
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Print ISSN:0950-5849
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Language:English
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Keywords:Science & Technology, Technology, Computer Science, Information Systems, Computer Science, Software Engineering, Computer Science, COMPUTER SCIENCE, INFORMATION SYSTEMS, COMPUTER SCIENCE, SOFTWARE ENGINEERING, FSMs, conformance test, F-UIOs, B-UIOs, UIOCs, fault masking, test quality, FINITE-STATE MACHINES, CHECKING SEQUENCES, INVERTIBILITY, DESIGN
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Full Text URL:
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Addresses:Brunel University
Sch Informat Syst Comp & Math
Uxbridge
Middx
England
UB8 3PH
Kings College London
Dept Comp
London
England
WC2R 2LS
Abstract
No abstract found
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