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Publication Detail
Reduction of thin-film ceria on Pt(111) by supported Pd nanoparticles probed with resonant photoemission
  • Publication Type:
    Journal article
  • Publication Sub Type:
    Article
  • Authors:
    Matharu J, Cabailh G, Lindsay R, Pang CL, Grinter DC, Skala T, Thornton G
  • Publisher:
    ELSEVIER SCIENCE BV
  • Publication date:
    06/2011
  • Pagination:
    1062, 1066
  • Journal:
    SURF SCI
  • Volume:
    605
  • Issue:
    11-12
  • Print ISSN:
    0039-6028
  • Language:
    EN
  • Keywords:
    Ceria, Thin film, Resonant photoemission, Palladium, RESPES, XPS, RAY PHOTOELECTRON-SPECTROSCOPY, MODEL CATALYST, OXIDE, CEO2, SURFACES, DIOXIDE, SYSTEMS, XPS
  • Addresses:
    Thornton, G
    UCL
    London Ctr Nanotechnol
    London
    WC1H 0AJ
    England

    UCL
    Dept Chem
    London
    WC1H 0AJ
    England
Abstract
Local defects present in CeO2-x films result in a mixture of Ce3+ and Ce4+ oxidation states. Previous studies of the Ce 3d region with XPS have shown that depositing metal nanoparticles on ceria films causes further reduction, with an increase in Ce3+ concentration. Here, we compare the use of XPS and resonant photoemission spectroscopy (RESPES) to estimate the concentration of Ce3+ and Ce4+ in CeO2-x films grown on Pt (111), and the variation of this concentration as a function of Pd deposition. Due to the nature of the electronic structure of CeO2-x, resonant peaks are observed for the 4d-4f transitions when the photon energy matches the resonant energy; (hv = 121.0 eV) for Ce3+ and (hv = 124.5 eV) for Ce4+. This results in two discrete resonant photoemission peaks in valence band spectra. The ratio of the difference of these peaks with off-resonance scans gives an indication of the relative contribution of Ce3+. Results from RESPES indicate reduction of CeO2-x on deposition of Pd, confirming earlier findings from XPS studies. (C) 2011 Elsevier B.V. All rights reserved.
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