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Publication Detail
Felling of individual freestanding nanoobjects using focused-ion-beam milling for investigations of structural and transport properties
  • Publication Type:
    Journal article
  • Publication Sub Type:
    Article
  • Authors:
    Li W, Fenton JC, Cui A, Wang H, Wang Y, Gu C, McComb DW, Warburton PA
  • Publisher:
    Institute of Physics
  • Publication date:
    21/02/2012
  • Place of publication:
    UK
  • Pagination:
    1, 7
  • Journal:
    Nanotechnology
  • Volume:
    23
  • Status:
    Published
  • Language:
    English
  • Addresses:
    London Centre for Nanotechnology
    UCL
    17-19 Gordon Street
    London
    WC1H 0AH
    UK

    London Centre for Nanotechnology
    Imperial College
    London
    SW7 2AZ
    UK

    Beijing National Lab of Condensed Matter Physics
    Chinese Academy of Sciences
    Institute of Physics
    Beijing
    100190
    People’s Republic of China
Abstract
We report that, to enable studies of their compositional, structural and electrical properties, freestanding individual nanoobjects can be selectively felled in a controllable way by the technique of low-current focused-ion-beam (FIB) milling with the ion beam at a chosen angle of incidence to the nanoobject. To demonstrate the suitability of the technique, we report results for zigzag/straight tungsten nanowires grown vertically on support substrates and then felled for characterization. We also describe a systematic investigation of the effect of the experimental geometry and parameters on the felling process and on the induced wire-bending phenomenon. The method of felling freestanding nanoobjects using FIB is an advantageous new technique enabling investigations of the properties of selected individual nanoobjects.
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London Centre for Nanotechnology
London Centre for Nanotechnology
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