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Publication Detail
Coherent X-ray diffraction imaging for strain analysis on single ZnO nanorod
  • Publication Type:
    Journal article
  • Publication Sub Type:
    Conference Proceeding
  • Authors:
    Xiong G, Leake S, Newton MC, Huang X, Harder R, Robinson IK
  • Publication date:
    01/12/2011
  • Pagination:
    1069, 1070
  • Journal:
    AIP Conference Proceedings
  • Volume:
    1399
  • Status:
    Published
  • Print ISSN:
    0094-243X
Abstract
Strain induced in nanostructure semiconductor materials can result in different electronic properties. Coherent x-ray diffraction (CXD) has emerged as a non-destructive tool for imaging of strain and defects. In this work CXD is applied on a single ZnO nanorod, diffraction patterns from Bragg reflection are used to reconstruct the strain distribution in the samples at a resolution of 40 nm. © 2011 American Institute of Physics.
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