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Publication Detail
Edge illumination X-ray phase-contrast imaging: nanoradian sensitivity at synchrotrons and translation to conventional sources
  • Publication Type:
    Conference
  • Authors:
    Diemoz PC, Endrizzi M, Hagen CK, Rau C, Bravin A, Speller RD, Robinson IK, Olivo A
  • Publisher:
    IOP
  • Publication date:
    03/04/2014
  • Place of publication:
    UK
  • Pagination:
    012006-1, 012006-9
  • Published proceedings:
    Journal of Physics: Conference Series
  • Volume:
    499
  • Series:
    Journal of Physics: Conference Series
  • Status:
    Published
  • Name of conference:
    22nd International Congress on X-Ray Optics and Microanalysis
  • Conference place:
    Hamburg, Germany
  • Conference start date:
    02/09/2013
  • Conference finish date:
    06/09/2013
  • Print ISSN:
    1742-6588
  • Language:
    English
  • EISSN:
    1742-6596
Abstract
Edge illumination is an X-ray phase-contrast imaging technique that can be efficiently applied to both synchrotron radiation and laboratory sources. Its implementation with these two types of setups is here described, and a recently developed method to perform quantitative retrieval of the object attenuation and refraction properties is presented. We report results obtained at two synchrotron radiation facilities and with one of the setups installed in our laboratories at University College London, which show that very high angular sensitivities can be obtained with this technique. The effect of different experimental parameters on the achievable sensitivity is also analyzed. The obtained results will be a useful guide for the design and optimization of future experimental layouts.
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